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CAREER: Characterization of Material Defects Using Broadband Two-Level-System Spectroscopy

US NSF grant open #nsf-2540460

Summary

Nontechnical Description This CAREER project advances the understanding of atomic-scale defects that limit the performance of next-generation materials in quantum electronics. These defects, known as two-level systems, can absorb energy and create noise in materials at very low temperatures. The research uses Broadband Cryogenic Transient Dielectric Spectroscopy (BCTDS), a measurement technique developed by the PI. The BCTDS technique enables direct probes of defects in quantum materials such as two-level systems. By connecting defects to how the materials are made and processed, the projec

CAREER: Characterization of Material Defec…
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